A Study of Total Focusing Method for Ultrasonic Nondestructive Testing

被引:4
|
作者
Tseng, Po-Yen [1 ]
Chang, Young-Fo [1 ]
Lin, Chao-Ming [2 ]
Nien, Wei-Jen [1 ]
Chang, Chih-Hsiung [3 ]
Huang, Chih-Chung [4 ]
机构
[1] Natl Chung Cheng Univ, Dept Earth & Environm Sci, Chiayi 62102, Taiwan
[2] Hsiuping Univ Sci & Technol, Dept Elect Engn, Taichung 41280, Taiwan
[3] Natl Chiayi Univ, Gen Educ Ctr, Chiayi 62103, Taiwan
[4] Fu Jen Catholic Univ, Dept Elect Engn, New Taipei City 24205, Taiwan
关键词
NDT; phased array; total focusing method; delay and sum; PHASED-ARRAY; FULL MATRIX;
D O I
10.1520/JTE20120188
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Commercial ultrasonic phased array (PA) systems can perform multiple inspections in real-time using array transducers. This approach involves firing array elements in a particular sequence to produce high-resolution images at a high frame rate with excellent signal-to-noise ratio (SNR). Unfortunately, PA systems are complex and expensive. This study proposes a simpler, cheaper, non-real-time ultrasonic array system incorporating the total focusing method (TFM), and the performance of the proposed system is compared with that of a commercial PA system. Studying results shows that both systems have similar apparent axial resolution, but the apparent lateral resolution of the proposed system is far better than the L-scan but falls short in S-scan of a commercial PA system under a quiet testing environment. Moreover, the array performance indicator (API) values of TFM are lower than those of S-scan and L-scan, and the TFM has the highest SNR than the other methods. These results show that the performance of TFM array system is better than the commercial PA system, except for time consumption when switching the channels. Automatically switching the source and receiver channels could further the development of inexpensive, high-performance TFM arrays for ultrasonic nondestructive testing (NDT). It is anticipated that rapid advancements in electronic components, computer science, and digital signal processing will lead to improvements in near-real-time TFM array systems.
引用
收藏
页码:557 / 563
页数:7
相关论文
共 50 条
  • [21] NONDESTRUCTIVE TESTING OF CARBON-FIBER-REINFORCED PLASTICS - STUDY OF AN ULTRASONIC RESONANCE METHOD
    BROWN, CG
    REYNOLDS, WN
    HANCOX, NL
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (04) : 782 - &
  • [22] Fuzzy Damage Extraction Method for Ultrasonic Nondestructive Testing Images
    Tsukuda, Koki
    Egawa, Tadahito
    Taniguchi, Kazuhiko
    Kuramoto, Kei
    Kobashi, Syoji
    Hata, Yutaka
    2013 IEEE 43RD INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC (ISMVL 2013), 2013, : 23 - 28
  • [23] Ultrasonic Nondestructive Testing Method for Mechanical Properties of Metallic Nanomaterials
    Li, Jiabing
    Zhong, Rui
    Shen, Xingwang
    Gao, Ziyun
    Zhang, Junwei
    Miao, Hansen
    Zhang, Ziqian
    2020 ASIA CONFERENCE ON GEOLOGICAL RESEARCH AND ENVIRONMENTAL TECHNOLOGY, 2021, 632
  • [24] Nondestructive testing of austenitic welds using method of ultrasonic array
    Yang J.
    Wu B.
    Jiao J.
    Wang Y.
    He C.
    Hanjie Xuebao/Transactions of the China Welding Institution, 2022, 43 (02): : 1 - 10
  • [25] Motion point calculation method for robortic Ultrasonic Nondestructive Testing
    Hu, Yi-xin
    Hao, Juan
    Yang, Wan-xin
    Guo, Can-zhi
    Jiang, Peng-fei
    PROCEEDINGS OF 2018 IEEE FAR EAST NDT NEW TECHNOLOGY & APPLICATION FORUM (IEEE FENDT 2018), 2018, : 85 - 89
  • [26] ADVANCEMENTS IN ULTRASONIC NONDESTRUCTIVE TESTING
    THOMPSON, DO
    IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1975, SU22 (03): : 238 - 238
  • [27] ULTRASONIC HOLOGRAPHY FOR NONDESTRUCTIVE TESTING
    KREUZER, JL
    MATERIALS EVALUATION, 1968, 26 (10) : 197 - &
  • [28] ULTRASONIC HOLOGRAPHY AND NONDESTRUCTIVE TESTING
    ALDRIDGE, EE
    MATERIALS RESEARCH AND STANDARDS, 1972, 12 (12): : 13 - +
  • [29] ULTRASONIC SPECTROSCOPY IN NONDESTRUCTIVE TESTING
    BROWN, AF
    SCIENCE PROGRESS, 1978, 65 (257) : 51 - 74
  • [30] Ultrasonic total focusing method for internal defects in composite insulators
    Hu, Hongwei
    Huang, Jinhan
    Lyu, Duo
    Liu, Wenzheng
    Xu, Xiaoqiang
    INSIGHT, 2024, 66 (06) : 346 - 352