Development of an Application Specific Integrated Circuit for Signal Detection in Experimental Studies of Fast Processes

被引:2
|
作者
Aulchenko, V. M. [1 ,2 ]
Zhulanov, V. V. [1 ,2 ]
Shekhtman, L., I [1 ,2 ]
机构
[1] Russian Acad Sci, Budker Inst Nucl Phys, Siberian Branch, Pr Akad Lavrenteva 11, Novosibirsk 630090, Russia
[2] Novosibirsk State Univ, Ul Pirogova 2, Novosibirsk 630090, Russia
关键词
synchrotron radiation; microstrip silicon detector; fast processes; application specific integrated circuit; SYNCHROTRON-RADIATION;
D O I
10.3103/S8756699020010112
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
This paper presents a new integrated circuit designed for signal readout in a silicon microstrip detector in experimental observations of fast processes at a synchrotron radiation beam. The first variants of this circuit were used in a prototype detector based on a microstrip silicon sensor and were tested at an intense synchrotron radiation beam at the VEPP-4M storage ring in the Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences. The results of the first measurements showed that the main objectives of this development were achieved: the time resolution and frame rate satisfy the initial specifications and the maximum detected signal in a linear mode of operation provides a significant increase in the detected photon flux compared to the previous version of the detector based on gas technology. The main problem detected during testing of the prototype is the relatively high noise level, which will be reduced in the next version of the integrated circuit by optimizing some circuit solutions.
引用
收藏
页码:81 / 88
页数:8
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