Efficiency enhancement in ultraviolet light-emitting diodes by manipulating polarization effect in electron blocking layer

被引:16
|
作者
Lu, Yu-Hsuan [1 ]
Fu, Yi-Keng [2 ]
Huang, Shyh-Jer [1 ]
Su, Yan-Kuin [1 ,3 ]
Xuan, Rong [2 ]
Pilkuhn, Manfred H. [1 ]
机构
[1] Natl Cheng Kung Univ, Ctr Technol, Inst Microelect & Adv Optoelect, Dept Elect Engn, Tainan 70101, Taiwan
[2] Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan
[3] Kun Shan Univ, Dept Elect Engn, Yung Kang, Tainan County, Taiwan
关键词
Aluminum alloys - III-V semiconductors - Gallium alloys - Charge injection - Electrons - Light emitting diodes - Ultraviolet radiation - Aluminum gallium nitride - Electron injection - Polarization - Efficiency - Semiconductor alloys;
D O I
10.1063/1.4801475
中图分类号
O59 [应用物理学];
学科分类号
摘要
The characteristics of the ultraviolet light-emitting diode (LED) with conventional and specifically designed electron blocking layers (EBLs) are investigated numerically and experimentally in this work. Simulation results show that delicately designed EBLs can not only capably perform the electron blocking function but also eliminate the incidental drawback of obstruction of hole injection caused by the nature of the large polarization field at the c-plane nitride heterojunction. It is shown that the polarization induced downward band bending can be mitigated when the portion of conventional EBL lying adjacent to the active region is replaced by a graduated AlGaN layer. The conduction band profile indicates that this replacement structure could have the capability of electron confinement similar to the conventional structure, and the valence band profile indicates that the spike induced by the polarization field is simultaneously eliminated, assisting the process of hole injection and distribution in the active region. Electron leakage over the EBL is thus obviously reduced, and the consumption efficiency of the injection carriers is improved, as expressed in the distribution of the electron current density. The experimental results show that the light output power can be significantly enhanced from 29.3 mW for the conventional device to 54.7 mW for the LED with the redesigned EBL structure. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:4
相关论文
共 50 条
  • [31] Efficiency enhancement of ultraviolet light-emitting diodes with segmentally graded p-type AlGaN layer
    王林媛
    宋伟东
    胡文晓
    李光
    罗幸君
    汪虎
    肖稼凯
    郭佳琦
    王幸福
    郝锐
    易翰翔
    吴启保
    李述体
    Chinese Physics B, 2019, (01) : 650 - 655
  • [32] Efficiency enhancement of ultraviolet light-emitting diodes with segmentally graded p-type AlGaN layer
    Wang, Lin-Yuan
    Song, Wei-Dong
    Hu, Wen-Xiao
    Li, Guang
    Luo, Xing-Jun
    Wang, Hu
    Xiao, Jia-Kai
    Guo, Jia-Qi
    Wang, Xing-Fu
    Hao, Rui
    Yi, Han-Xiang
    Wu, Qi-Bao
    Li, Shu-Ti
    CHINESE PHYSICS B, 2019, 28 (01)
  • [33] Performance enhancement of ultraviolet light-emitting diodes by manipulating Al composition of InGaN/AlGaN superlattice strain release layer
    Qian, Yinzuo
    Du, Peng
    Liu, Pengfei
    Zhou, Shengjun
    JOURNAL OF APPLIED PHYSICS, 2022, 131 (09)
  • [34] Effect of hole blocking layer on lifetime of organic light-emitting diodes
    Yuan, Yong-bo
    Lian, Jia-rong
    Zhou, Xiang
    AD'07: Proceedings of Asia Display 2007, Vols 1 and 2, 2007, : 143 - 146
  • [35] Investigation of AlGaN-Based Near-Ultraviolet Light-Emitting Diodes with a Trapezoidal Electron Blocking Layer
    Jihang Li
    Huaimin Gu
    Guang Li
    Lang Chen
    Hengzhi Shi
    Xinggang Shen
    Xianqi Yang
    Nana Liu
    Rui Yuan
    Jinyuan Zhang
    Journal of Electronic Materials, 2019, 48 : 6280 - 6286
  • [36] Numerical study of the advantages of ultraviolet light-emitting diodes with a single step quantum well as the electron blocking layer
    W. Tian
    Z. H. Feng
    B. Liu
    H. Xiong
    J. B. Zhang
    J. N. Dai
    S. J. Cai
    C. Q. Chen
    Optical and Quantum Electronics, 2013, 45 : 381 - 387
  • [37] Investigation of AlGaN-Based Near-Ultraviolet Light-Emitting Diodes with a Trapezoidal Electron Blocking Layer
    Li, Jihang
    Gu, Huaimin
    Li, Guang
    Chen, Lang
    Shi, Hengzhi
    Shen, Xinggang
    Yang, Xianqi
    Liu, Nana
    Yuan, Rui
    Zhang, Jinyuan
    JOURNAL OF ELECTRONIC MATERIALS, 2019, 48 (10) : 6280 - 6286
  • [38] Numerical study of the advantages of ultraviolet light-emitting diodes with a single step quantum well as the electron blocking layer
    Tian, W.
    Feng, Z. H.
    Liu, B.
    Xiong, H.
    Zhang, J. B.
    Dai, J. N.
    Cai, S. J.
    Chen, C. Q.
    OPTICAL AND QUANTUM ELECTRONICS, 2013, 45 (05) : 381 - 387
  • [39] Advantages of Polarization Engineered Quantum Barriers in III-Nitride Deep Ultraviolet Light-Emitting Diodes: An Electron Blocking Layer Free Approach
    Velpula, Ravi Teja
    Jain, Barsha
    Das, Samadrita
    Lenka, Trupti Ranjan
    Nguyen, Hieu Pham Trung
    MICRO AND NANOELECTRONICS DEVICES, CIRCUITS AND SYSTEMS, 2023, 904 : 97 - 102
  • [40] Luminescence enhancement of near ultraviolet light-emitting diodes
    Lin, Li
    Jensen, Flemming
    Herstrom, Berit
    Ou, Haiyan
    2016 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP), 2016,