Developing Models for a 0.8 mm Coaxial VNA Calibration Kit within the NIST Microwave Uncertainty Framework

被引：0

作者：

Jargon, Jeffrey A. ^{[1
]}

Long, Christian J. ^{[1
]}

Feldman, Ari ^{[1
]}

Martens, Jon ^{[2
]}

机构：

[1] NIST, 325 Broadway,M-S 672-03, Boulder, CO 80305 USA

[2] Anritsu Co, Morgan Hill, CA 95037 USA

来源：

2020 94TH ARFTG MICROWAVE MEASUREMENT SYMPOSIUM (ARFTG): RF TO MILLIMETER-WAVE MEASUREMENT TECHNIQUES FOR 5G AND BEYOND | 2020年

关键词：

calibration; coaxial; physical models; uncertainty; vector network analyzer; verification;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We developed models for a 0.8 mm coaxial vector network analyzer (VNA) calibration kit within the NIST Microwave Uncertainty Framework. First, we created physical models of commercially-available standards and included error mechanisms in each of the standards' constituent parameters that were utilized to propagate uncertainties. Next, we calibrated a network analyzer with this calibration kit and compared measurements and uncertainties of two verification devices with data provided by the manufacturer. We found the measurements agreed to within their respective uncertainties.

引用

页数：4

共 3 条

[1] Developing Models for Type-N Coaxial VNA Calibration Kits within the NIST Microwave Uncertainty Framework
Jargon, Jeffrey A.
Williams, Dylan F.
Hale, Paul D.
[J]. 2016 87TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG), 2016,
[2] Physical Models for 2.4 mm and 3.5 mm Coaxial VNA Calibration Kits Developed within the NIST Microwave Uncertainty Framework
Jargon, Jeffrey A.
Cho, Chihyun
Williams, Dylan F.
Hale, Paul D.
[J]. 2015 85TH ARFTG MICROWAVE MEASUREMENT CONFERENCE, 2015,
[3] Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework
Jargon, Jeffrey A.
Williams, Dylan F.
Wallis, T. Mitch
LeGolvan, Denis X.
Hale, Paul D.
[J]. 2012 79TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG), 2012,

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