Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework

被引:0
|
作者
Jargon, Jeffrey A. [1 ]
Williams, Dylan F. [1 ]
Wallis, T. Mitch [1 ]
LeGolvan, Denis X. [1 ]
Hale, Paul D. [1 ]
机构
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
关键词
Electronic calibration unit; traceability; uncertainty; vector network analyzer; NETWORK-ANALYZER CALIBRATION;
D O I
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a method for establishing traceability of a commercial electronic calibration unit for vector network analyzers by characterizing the scattering parameters of its internal states with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic calibration unit characterized, we use it to calibrate a network analyzer, and characterize a number of verification devices with corresponding uncertainties. We also characterize the same verification devices using one of the previous multiline TRL calibrations, and compare results.
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页数:5
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