Real time ellipsometric study of boron nitride thin film growth

被引:0
|
作者
Bertran, E [1 ]
Canillas, A [1 ]
Campmany, J [1 ]
Kasmi, ME [1 ]
Pascual, E [1 ]
Costa, J [1 ]
Andujar, JL [1 ]
机构
[1] UNIV BARCELONA,DEPT FIS APLICADA & ELECT,LFCF,E-08028 BARCELONA,SPAIN
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暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:307 / 312
页数:6
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