The Raman and infrared spectra depend on oxidation in nanometer silicon powder

被引：3
|
作者：
Zuo, J [1 ]
Jia, JH
Xu, CY
机构：
[1] Univ Sci & Technol China, Struct Res Lab, Hefei 230026, Peoples R China
[2] Acad Sinica, Inst Solid State Phys, Hefei 230026, Peoples R China
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1999年 / 38卷 / 6A期
关键词：
Raman spectroscopy; infrared spectroscopy; oxidation; nanometer silicon powder;
D O I：
10.1143/JJAP.38.3548
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Nanometer silicon powder of 10 nm scale have been prepared by laser induced chemical vapor deposition. The Raman and infrared (IR) spectra of the nanometer silicon powder annealed at different temperature have been measured. The observed shifts in the Raman spectra are ascribed to the reduction of the silicon crystallite size by the oxidation of the surface in annealing process.
引用
收藏
页码：3548 / 3549
页数：2
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