Probing semiconductor gap states with resonant tunneling - art. no. 066403

被引:32
|
作者
Loth, S
Wenderoth, M
Winking, L
Ulbrich, RG
Malzer, S
Döhler, GH
机构
[1] Univ Gottingen, Inst Phys 4, D-37077 Gottingen, Germany
[2] Univ Erlangen Nurnberg, Max Planck Res Grp, Inst Opt Informat & Photon, D-91058 Erlangen, Germany
关键词
D O I
10.1103/PhysRevLett.96.066403
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Tunneling transport through the depletion layer under a GaAs {110} surface is studied with a low temperature scanning tunneling microscope (STM). The observed negative differential conductivity is due to a resonant enhancement of the tunneling probability through the depletion layer mediated by individual shallow acceptors. The STM experiment probes, for appropriate bias voltages, evanescent states in the GaAs band gap. Energetically and spatially resolved spectra show that the pronounced anisotropic contrast pattern of shallow acceptors occurs exclusively for this specific transport channel. Our findings suggest that the complex band structure causes the observed anisotropies connected with the zinc blende symmetry.
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页数:4
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