Speckle-structured illumination for 3D phase and fluorescence computational microscopy

被引:26
|
作者
Yeh, Li-Hao [1 ]
Chowdhury, Shwetadwip [1 ]
Repina, Nicole A. [2 ]
Waller, Laura [1 ,2 ]
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Grad Program Bioengn, Berkeley, CA 94720 USA
来源
BIOMEDICAL OPTICS EXPRESS | 2019年 / 10卷 / 07期
基金
美国国家科学基金会;
关键词
OPTICAL DIFFRACTION TOMOGRAPHY; HIGH-RESOLUTION; WIDE-FIELD; HIGH-THROUGHPUT; FOURIER PTYCHOGRAPHY; LATERAL RESOLUTION; INTENSITY; SPEED; LIMIT; RECONSTRUCTION;
D O I
10.1364/BOE.10.003635
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
High-content biological microscopy targets high-resolution imaging across large fields-of-view, often achieved by computational imaging approaches. Previously, we demonstrated 2D multimodal high-content microscopy via structured illumination microscopy (SIM) with resolution > 2x the diffraction limit, using speckle illumination from Scotch tape. In this work, we extend the method to 3D by leveraging the fact that the speckle illumination is in fact a 3D structured pattern. We use both a coherent and an incoherent imaging model to develop algorithms for joint retrieval of the 3D super-resolved fluorescent and complex-held distributions of the sample. Our reconstructed images resolve features beyond the physical diffraction-limit set by the system's objective and demonstrate 3D multimodal imaging with similar to 0.6 x 0.6 x 6 mu m(3) resolution over a volume of similar to 314 x 500 x 24 mu m(3). (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:3635 / 3653
页数:19
相关论文
共 50 条
  • [31] Real time 3D fluorescence microscopy by two beam interference illumination
    Neil, MAA
    Juskaitis, R
    Wilson, T
    OPTICS COMMUNICATIONS, 1998, 153 (1-3) : 1 - 4
  • [32] Speckle-based phase retrieval applied to 3D microscopy
    Anand, Arun
    Javidi, Bahram
    THREE-DIMENSIONAL IMAGING, VISUALIZATION, AND DISPLAY 2010 AND DISPLAY TECHNOLOGIES AND APPLICATIONS FOR DEFENSE, SECURITY, AND AVIONICS IV, 2010, 7690
  • [33] Tomographic microscopy of 3D phase objects with spatially incoherent illumination
    Poplevina, L
    Levin, GG
    Vishnyakov, GN
    THREE-DIMENSIONAL AND MULTIDIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING VI, PROCEEDINGS OF, 1999, 3605 : 218 - 227
  • [34] Structured illumination fluorescence Fourier ptychographic microscopy
    Xiu, Peng
    Chen, Youhua
    Kuang, Cuifang
    Fang, Yue
    Wang, Yifan
    Fan, Jiannan
    Xu, Yingke
    Liu, Xu
    OPTICS COMMUNICATIONS, 2016, 381 : 100 - 106
  • [35] Structured-illumination microscopy on technical surfaces: 3D metrology with nanometer sensitivity
    Vogel, Markus
    Yang, Zheng
    Kessel, Alexander
    Kranitzky, Christoph
    Faber, Christian
    Haeusler, Gerd
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII, 2011, 8082
  • [36] Total variation and spatial iteration-based 3D structured illumination microscopy
    Cai, Mingxuan
    Zhu, Hongfei
    Sun, Yile
    Yin, Lu
    Xu, Fanghui
    Wu, Hanmeng
    Hao, Xiang
    Zhou, Renjie
    Kuang, Cuifang
    Liu, Xu
    OPTICS EXPRESS, 2022, 30 (05) : 7938 - 7953
  • [37] 3D Structured Illumination Microscopy via Channel Attention Generative Adversarial Network
    Qiao, Chang
    Chen, Xingye
    Zhang, Siwei
    Li, Di
    Guo, Yuting
    Dai, Qionghai
    Li, Dong
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2021, 27 (04)
  • [38] Phase optimisation for structured illumination microscopy
    Wicker, Kai
    Mandula, Ondrej
    Best, Gerrit
    Fiolka, Reto
    Heintzmann, Rainer
    OPTICS EXPRESS, 2013, 21 (02): : 2032 - 2049
  • [39] Phase Estimation of Illumination Pattern in Structured Illumination Microscopy
    Pospisil, Jakub
    Fliegei, Karel
    Klima, Milos
    2017 27TH INTERNATIONAL CONFERENCE RADIOELEKTRONIKA (RADIOELEKTRONIKA), 2017, : 174 - 177
  • [40] Stereophotogrammetric 3D shape measurement by holographic methods using structured speckle illumination combined with interferometry
    Babovsky, Holger
    Grosse, Marcus
    Buehl, Johannes
    Kiessling, Armin
    Kowarschik, Richard
    OPTICS LETTERS, 2011, 36 (23) : 4512 - 4514