X-ray microscopy of multiphase polymeric materials

被引:3
|
作者
Ade, H
Smith, AP
Zhuang, GR
Wood, B
Plotzker, I
Rightor, E
Liu, DJ
Lui, SC
Sloop, C
机构
关键词
D O I
10.1557/PROC-437-99
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have utilized the scanning transmission x-ray microscope at Brookhaven National Laboratory to acquire high energy resolution spectra of various polymers and to investigate the bulk characteristics of multiphasic polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present studies ranging from phase separated liquid crystalline polyesters and polyurethanes to various polymer blends. Improvements in the NEXAFS imaging and spectral acquisition protocol in the recent past provide much improved spectral fidelity and include in situ energy calibration with CO2.
引用
收藏
页码:99 / 105
页数:7
相关论文
共 50 条
  • [21] X-RAY MICROSCOPY
    YADA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (04): : 284 - 284
  • [22] X-ray microscopy
    Lider, V. V.
    PHYSICS-USPEKHI, 2017, 60 (02) : 187 - 203
  • [23] X-RAY MICROSCOPY
    MICHETTE, AG
    REPORTS ON PROGRESS IN PHYSICS, 1988, 51 (12) : 1525 - 1606
  • [24] X-ray Microscopy
    Resnick, Andrew
    CONTEMPORARY PHYSICS, 2020, 61 (02) : 147 - 148
  • [25] X-ray microscopy
    Rokhlin, SI
    Kim, JY
    Zoofan, B
    TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS, 2003, 5045 : 132 - 146
  • [26] X-RAY CONTACT MICROSCOPY AND X-RAY LASER
    TOMIE, T
    SHIMIZU, H
    MAJIMA, T
    YAMADA, M
    KANAYAMA, T
    MIURA, E
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1992, (125): : 393 - 396
  • [27] Characterizing Automotive Fuel Cell Materials by Soft X-Ray Scanning Transmission X-Ray Microscopy
    Hitchcock, A. P.
    Lee, V.
    Wu, J.
    West, M. M.
    Cooper, G.
    Berejnov, V.
    Soboleva, T.
    Susac, D.
    Stumper, J.
    XRM 2014: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2016, 1696
  • [28] RANDOMNESS IN MULTIPHASE X-RAY SCATTERERS
    GOODISMAN, J
    BRUMBERGER, H
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (AUG) : 398 - 399
  • [29] X-ray photoemission electron microscopy for the study of semiconductor materials
    Anders, S
    Stammler, T
    Padmore, HA
    Terminello, LJ
    Jankowski, AF
    Stöhr, J
    Díaz, J
    Cossy-Favre, A
    Singh, S
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 873 - 877
  • [30] X-ray spectro-microscopy of complex materials and surfaces
    Stöhr, J.
    Anders, S.
    1600, IBM, Armonk, NY, United States (44):