Complex permittivity determination based on a radio frequency device

被引：13

作者：

Liu, Weina ^{[1
,2
]}

Xu, Lei ^{[1
,2
]}

Yang, XinWei ^{[3
]}

Shi, Yanyan ^{[1
,2
]}

Zhan, Huawei ^{[1
,2
]}

机构：

[1] Henan Normal Univ, Coll Elect & Elect Engn, Xinxiang 453007, Peoples R China

[2] Henan Key Discipline Open Lab Electromagnet Wave, Xinxiang 453007, Peoples R China

[3] Southwest Univ Sci & Technol, Sch Informat Engn, Mianyang 621010, Peoples R China

来源：

SENSORS AND ACTUATORS A-PHYSICAL | 2018年 / 272卷

关键词：

RESONATOR; SENSOR;

D O I：

10.1016/j.sna.2017.12.015

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe the design, fabrication, and evaluation of a new on-wafer four port device for measurement the complex permittivity of materials over the continuous frequency range from 1.5 GHz to 2.75 GHz. The proposed device consists of two 3dB directional coupler connected through two U-shaped slot line sections with the same length. This method can afford high accurate measurement results by only two measurements of scattering parameters. One measurement is for the empty device and the other for the material under test loaded on U-shape slot-line of the device. Additionally, we compute the complex permittivity of the materials under test from the measured scattering parameters. Our measurements show excellent agreement with transmission methods. (C) 2017 Elsevier B.V. All rights reserved.

引用

页码：75 / 82

页数：8

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