Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation

被引：10
|
作者：
Kohn, V. G. [1 ,2 ]
Prosekov, P. A. [1 ,2 ]
Seregin, A. Yu [1 ,2 ]
Kulikov, A. G. [1 ,2 ]
Pisarevsky, Yu V. [1 ,2 ]
Blagov, A. E. [1 ,2 ]
Kovalchuk, M. V. [1 ,2 ]
机构：
[1] Natl Res Ctr Kurchatov Inst, Moscow 123182, Russia
[2] Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Shubnikov Inst Crystallog, Moscow 119333, Russia
来源：
CRYSTALLOGRAPHY REPORTS | 2019年 / 64卷 / 01期
基金：
俄罗斯基础研究基金会;
关键词：
DIFFRACTION;
D O I：
10.1134/S1063774519010139
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
A new scheme of two-beam X-ray diffractometry on the X-Ray Crystallography and Physical Materials Science (XCPM) beamline at the Kurchatov Synchrotron Radiation Source (KSRS) has been experimentally investigated. The scheme includes a standard double-crystal monochromator and a narrow slit installed in front of the sample. Measurements have been performed for the Si 111 and 311 reflections in the monochromator and the Si 111 and 220 reflections in the sample crystal. It is shown that this scheme allows one to obtain a near-proper diffraction reflection curve even in the case of symmetric diffraction if the Bragg angle for the monochromator exceeds the Bragg angle for the crystal sample by a factor of 2 or more. The experimental results coincide well with the theory.
引用
收藏
页码：24 / 29
页数：6
相关论文
共 50 条
  • [41] Feasibility study of silicon PN photodiodes as X-ray intensity monitors for high flux X-ray beam with synchrotron radiation
    Sato, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 436 (1-2): : 285 - 290
  • [42] Applications of pixellated GaAs X-ray detectors in a synchrotron radiation beam
    Watt, J
    Bates, R
    Campbell, M
    Mathieson, K
    Mikulec, B
    O'Shea, V
    Passmore, MS
    Schwarz, C
    Smith, KM
    Whitehill, C
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 460 (01): : 185 - 190
  • [43] Control of x-ray beam fluctuation in synchrotron radiation lithography beamline
    Shimano, Hiroki
    Tanaka, Hirofumi
    Ozaki, Yoshihiko
    Marumoto, Kenji
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1995, 34 (10): : 5856 - 5861
  • [44] A NEW BEAM POSITION MONITOR FOR X-RAY SYNCHROTRON RADIATION FACILITIES
    STEFAN, PM
    SIDDONS, DP
    HASTINGS, JB
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 255 (03): : 598 - 602
  • [45] Feasibility study of silicon PN photodiodes as X-ray intensity monitors for high flux X-ray beam with synchrotron radiation
    Sato, Kazumichi
    Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1999, 436 (1-2): : 285 - 290
  • [46] Phase retrieval with two-beam off-axis x-ray holography
    Kohmura, Y
    Sakurai, T
    Ishikawa, T
    Suzuki, Y
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (04) : 1781 - 1784
  • [47] X-RAY MICROSCOPY WITH SYNCHROTRON RADIATION
    SCHMAHL, G
    RUDOLPH, D
    NIEMANN, B
    MEYERILSE, W
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1986, 11 (05): : 389 - 396
  • [48] MONOCHROMATORS FOR X-RAY SYNCHROTRON RADIATION
    CACIUFFO, R
    MELONE, S
    RUSTICHELLI, F
    BOEUF, A
    PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1987, 152 (01): : 1 - 71
  • [49] AN X-RAY DIFFRACTOMETER FOR SYNCHROTRON RADIATION
    ALLOCCA, L
    IANNUZZI, M
    LAMONACA, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 219 (01): : 227 - 232
  • [50] X-RAY MICROSCOPY WITH SYNCHROTRON RADIATION
    NIEMANN, B
    RUDOLPH, D
    SCHMAHL, G
    APPLIED OPTICS, 1976, 15 (08): : 1883 - 1884
12345