Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation

被引：10

作者：

Kohn, V. G. ^{[1
,2
]}

Prosekov, P. A. ^{[1
,2
]}

Seregin, A. Yu ^{[1
,2
]}

Kulikov, A. G. ^{[1
,2
]}

Pisarevsky, Yu V. ^{[1
,2
]}

Blagov, A. E. ^{[1
,2
]}

Kovalchuk, M. V. ^{[1
,2
]}

机构：

[1] Natl Res Ctr Kurchatov Inst, Moscow 123182, Russia

[2] Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Shubnikov Inst Crystallog, Moscow 119333, Russia

来源：

CRYSTALLOGRAPHY REPORTS | 2019年 / 64卷 / 01期

基金：

俄罗斯基础研究基金会;

关键词：

DIFFRACTION;

D O I：

10.1134/S1063774519010139

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

A new scheme of two-beam X-ray diffractometry on the X-Ray Crystallography and Physical Materials Science (XCPM) beamline at the Kurchatov Synchrotron Radiation Source (KSRS) has been experimentally investigated. The scheme includes a standard double-crystal monochromator and a narrow slit installed in front of the sample. Measurements have been performed for the Si 111 and 311 reflections in the monochromator and the Si 111 and 220 reflections in the sample crystal. It is shown that this scheme allows one to obtain a near-proper diffraction reflection curve even in the case of symmetric diffraction if the Bragg angle for the monochromator exceeds the Bragg angle for the crystal sample by a factor of 2 or more. The experimental results coincide well with the theory.

引用

页码：24 / 29

页数：6

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A. E. Blagov
M. V. Kovalchuk
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