A distribution-free lower bound for availability of quantile-based inspection schemes

被引：23
|
作者：
Yang, Y [1 ]
Klutke, GA
机构：
[1] Samsung Elect Co Ltd, ME Operat Team, SCM Grp, Yongin 449711, Kyunggi Do, South Korea
[2] Texas A&M Univ, Dept Ind Engn, College Stn, TX 77843 USA
来源：
IEEE TRANSACTIONS ON RELIABILITY | 2001年 / 50卷 / 04期
基金：
美国国家科学基金会;
关键词：
inspection policy; inspection rate; limiting average-availability; quantile-based inspection;
D O I：
10.1109/24.983406
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper develops a lower bound for the availability of quantile-based inspection schemes when device lifetimes are assumed to have an increasing failure rate. The lower bound is useful in designing inspection schemes when lifetime distributions are not explicitly known, but must be estimated from limited failure data.
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页码：419 / 421
页数：3
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