'Ultrafast' extended to X-rays: Femtosecond time-resolved X-ray diffraction

被引：12
|
作者：
von der Linde, D [1 ]
Sokolowski-Tinten, K
Blome, C
Dietrich, C
Tarasevitch, A
Cavalleri, A
Squier, JA
机构：
[1] Univ Essen Gesamthsch, Inst Laser & Plasmaphys, D-45117 Essen, Germany
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[3] Univ Calif San Diego, La Jolla, CA 92093 USA
来源：
ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS | 2001年 / 215卷
关键词：
femtosecond; X-ray; diffraction;
D O I：
10.1524/zpch.2001.215.12.1527
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
For a long time the capability to perform measurements with femtosecond time-resolution belonged exclusively to the domain of optics. However, in the last few years laser-driven X-ray sources have been developed which enable femtosecond time-resolution to be extended to the X-ray regime.
引用
收藏
页码：1527 / 1541
页数：15
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