Ultrafast time-resolved X-ray diffraction of coherent phonons in semiconductors

被引：0
|
作者：
Nakamura, K. G. [1 ]
Hironaka, Y. [1 ]
Irisawa, J. [1 ]
Kondo, K. [1 ]
机构：
[1] Tokyo Inst Technol, Mat & Struct Lab, Yokohama, Kanagawa 2268503, Japan
来源：
2006 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 | 2006年
关键词：
D O I：
10.1109/LEOS.2006.279111
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：889 / +
页数：2
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