High-resolution X-ray powder diffraction studies of some Mg- and Si-substituted brownmillerites

被引:2
|
作者
Lewis, AC
Cockroft, JK
Barnes, P
Hall, C
Cernik, RJ
Tang, CC
Pollmann, H
机构
[1] SCHLUMBERGER CAMBRIDGE RES LTD,CAMBRIDGE CB3 0EL,ENGLAND
[2] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND
[3] UNIV ERLANGEN NURNBERG,D-91054 ERLANGEN,GERMANY
关键词
structure determination;
D O I
10.4028/www.scientific.net/MSF.228-231.759
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Structure refinements from powder diffraction data are presented for two compounds of this type, Ca2Fe1.4Mg0.3Si0.3O5 and Ca2Fe1.07Al0.67Mg0.13Si0.13O5. Although site occupancies have not been successfully determined for the latter, results confirm the anion-deficient perovskite structure for both compounds.
引用
收藏
页码:759 / 763
页数:5
相关论文
共 50 条
  • [31] Crystal structure of propylthiouracil determined using high-resolution synchrotron X-ray powder diffraction
    Ferreira, Fabio Furlan
    Trindade, Antonio Carlos
    Antonio, Selma Gutierrez
    Paiva-Santos, Carlos de Oliveira
    CRYSTENGCOMM, 2011, 13 (17): : 5474 - 5479
  • [32] Symmetrization of diffraction peak profiles measured with a high-resolution synchrotron X-ray powder diffractometer
    Ida, T
    Hibino, H
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2006, 39 : 90 - 100
  • [33] HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF MULTILAYERS
    CHRISTENSEN, FE
    HORNSTRUP, A
    SCHNOPPER, HW
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 : 252 - 257
  • [34] High-resolution X-ray diffraction of silicon-on-nothing
    Servidori, M
    Ottaviani, G
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2005, 38 : 740 - 748
  • [35] Towards high-resolution ptychographic x-ray diffraction microscopy
    Takahashi, Yukio
    Suzuki, Akihiro
    Zettsu, Nobuyuki
    Kohmura, Yoshiki
    Senba, Yasunori
    Ohashi, Haruhiko
    Yamauchi, Kazuto
    Ishikawa, Tetsuya
    PHYSICAL REVIEW B, 2011, 83 (21)
  • [36] High-resolution X-ray diffraction from imperfect heterostructures
    Nuovo Cim Soc Ital Fis D Condens Matter Atom Molec Chem Phys, 2-4 (385):
  • [37] Nanotube structure revealed by high-resolution X-ray diffraction
    Xu, G
    Feng, ZC
    Popovic, Z
    Lin, JY
    Vittal, JJ
    ADVANCED MATERIALS, 2001, 13 (04) : 264 - +
  • [38] Uniaxial pressure in a High-resolution X-ray Diffraction environment
    Frehse, V. E. S.
    Lombardi, G. A.
    Corsaletti Filho, J. C.
    Adriano, C.
    dos Reis, R. D.
    Calligaris, G. A.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2021, 77 : C1215 - C1215
  • [39] X-ray high-resolution diffraction using refractive lenses
    Drakopoulos, M
    Snigirev, A
    Snigireva, I
    Schilling, J
    APPLIED PHYSICS LETTERS, 2005, 86 (01) : 014102 - 1
  • [40] High-resolution scanning coherent X-ray diffraction microscopy
    Thibault, P.
    Dierolf, M.
    Menzel, A.
    Bunk, O.
    Pfeiffer, F.
    UVX 2008: 9E COLLOQUE SUR LES SOURCES COHERENTES ET INCOHERENTES UV, VUV ET X; APPLICATIONS ET DEVELOPPEMENTS RECENTS, 2008, : 145 - 149