Recent Developments on X-ray Phase Contrast Imaging Technology at CSEM

被引：5

作者：

Kottler, Christian ^{[1
]}

Revol, Vincent ^{[1
]}

Kaufmann, Rolf ^{[1
]}

Urban, Claus ^{[1
]}

Blanc, Nicolas ^{[1
]}

Niedermann, Philippe ^{[2
]}

Cardot, Francis ^{[2
]}

Dommann, Alex ^{[2
]}

机构：

[1] Ctr Suisse Elect & Microtech SA, Technopk Str 1, CH-8005 Zurich, Switzerland

[2] Ctr Suisse Elect & Microtech SA, CH-2002 Neuchatel, Switzerland

来源：

INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS | 2012年 / 1466卷

关键词：

X-ray; differential phase contrast; imaging; grating interferometry; computerized tomography; fiber reinforced plastics; TALBOT INTERFEROMETRY; TOMOGRAPHY;

D O I：

10.1063/1.4742263

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray phase contrast imaging (XPCi) using the Talbot-Lau grating interferometer attracts increasing attention for its implementation in various fields of applications such as in the (bio-) medical domain, non-destructive testing or security. Since the method is compatible with laboratory X-ray tube sources as well as with large field of view digital X-ray image sensors, it has a large potential to provide XPCi for industrial and medical applications as widespread as conventional X-raying is. Here, we report on our recent results and measurements regarding the grating interferometer technology.

引用

页码：18 / 22

页数：5

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