Wavefront-coded phase measuring deflectometry for the all-focused measurement

被引:9
|
作者
Niu, Zhenqi [1 ,2 ,3 ,4 ]
Wang, Junhua [5 ,6 ]
Tian, Yuhan [5 ]
Wu, Zhen [1 ,2 ,3 ,4 ]
Wei, Chaoyang [1 ,2 ,3 ,4 ]
Shao, Jianda [2 ,3 ,4 ,7 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Precis Opt Mfg & Testing Ctr, Shanghai 201800, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab High Power Laser Mat, Shanghai 201800, Peoples R China
[3] Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
[4] China Russian Belt & Rd Joint Lab Laser Sci, Shanghai 201800, Peoples R China
[5] Fudan Univ, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200438, Peoples R China
[6] Fudan Univ, Inst Optoelect, Shanghai Frontiers Sci Res Base Intelligent Optoel, Shanghai 200438, Peoples R China
[7] Univ Chinese Acad Sci, Hangzhou Inst Adv Study, Hangzhou 310024, Peoples R China
关键词
Compendex;
D O I
10.1364/OL.470949
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Phase measuring deflectometry is a powerful measuring method for complex optical surfaces, which captures the reflected fringe images encoded on the screen under the premise of focusing the measured specular surface. Due to the limited depth of field of the camera, the captured images and the measured surface cannot be focused at the same time. To solve the position-angle uncertainty issue, in this Letter, the wavefront coding technology is used to modulate the imaging wavefront of the deflectometry, thereby making the measuring system insensitive to the defocus and other low-order aberration including astigmatism, field curvature, and so on. To obtain the accurate phase, the captured fringe images are deconvoluted using the modulated point spread function to reduce the phase error. Demonstrated with a highly curved spherical surface, the measurement accuracy can be improved by four times. Experiments demonstrate that the proposed method can successfully reconstruct the complex surfaces defocusing the captured images, which can greatly release the focusing requirement and improve measurement accuracy. (C) 2022 Optica Publishing Group
引用
收藏
页码:4770 / 4773
页数:4
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