On the Validity of Momentum Relaxation Time in Low-Dimensional Carrier Gases

被引:0
|
作者
Stanojevic, Z. [1 ]
Baumgartner, O. [1 ]
Karner, M. [2 ]
Filipovic, La [1 ]
Kernstock, C. [2 ]
Kosina, H. [1 ]
机构
[1] TU Wien, Inst Microelect, A-1040 Vienna, Austria
[2] Global TCAD Solut GmbH, A-1010 Vienna, Austria
来源
2014 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD) | 2014年
关键词
CYCLOTRON-RESONANCE; SILICON; MOBILITY;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The momentum relaxation time (MRT) is widely used to simplify low-field mobility calculations including anisotropic scattering processes. Although not always fully justified, it has been very practical in simulating transport in bulk and in low-dimensional carrier gases alike. We review the assumptions behind the MRT, quantify the error introduced by its usage for low-dimensional carrier gases, and point out its weakness in accounting for inter-subband interaction, occurring specifically at low inversion densities.
引用
收藏
页码:181 / 184
页数:4
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