Effect of nitrogen gas on the lifetime at carbon nanotube field emitters for electron-impact ionization mass spectrometry

被引：2
|
作者：
Getty, Stephanie A. [1 ]
Bis, Rachael A. [1 ]
Snyder, Stacy [2 ]
Gehrels, Emily [1 ]
Ramirez, Kristina [1 ]
King, Todd T. [1 ]
Roman, Patrick A. [3 ]
Mahaffy, Paul R. [4 ]
机构：
[1] NASA, Goddard Space Flight Ctr, Mat Engn Branch, Mailstop 541-0, Greenbelt, MD 20771 USA
[2] Lehigh Univ, Dept Phys, Bethlehem, PA 18015 USA
[3] NASA, Goddard Space Flight Ctr, Detector Syst Branch, Greenbelt, MD 20771 USA
[4] NASA, Goddard Space Flight Ctr, Atmospher Expt Lab, Greenbelt, MD 20771 USA
来源：
MICRO (MEMS) AND NANOTECHNOLOGIES FOR SPACE, DEFENSE, AND SECURITY II | 2008年 / 6959卷
关键词：
carbon nanotube; field emission; lifetesting; electron-impact ionization;
D O I：
10.1117/12.776914
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The lifetime of a patterned carbon nanotube film is evaluated for use as the cold cathode field emission ionization source of a miniaturized mass spectrometer. Emitted current is measured as a function of time for varying partial pressures of nitrogen gas to explore the robustness and lifetime of carbon nanotube cathodes near the expected operational voltages (70-100 eV) for efficient ionization in mass spectrometry. As expected, cathode lifetime scales inversely with partial pressure of nitrogen. Results are presented within the context of previous carbon nanotube investigations, and implications for planetary science mass spectrometry applications are discussed.
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页数：10
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