Measurement Setup for Imaging Applications Using Frequency Scanning Illumination

被引：10

作者：

Alvarez, Yuri ^{[1
]}

Garcia Gonzalez, Cebrian ^{[1
]}

Vazquez Antuna, Carlos ^{[1
]}

Ver-Hoeye, Samuel ^{[1
]}

Las-Heras, Fernando ^{[1
]}

机构：

[1] Univ Oviedo, Dept Elect Engn, Area Signal Theory & Commun TSC, Gijon 33203, Spain

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2012年 / 61卷 / 11期

关键词：

Frequency scanning antenna array; imaging; inverse methods; near-field characterization; source reconstruction method (SRM); INVERSE SCATTERING TECHNIQUE; SHAPE RECONSTRUCTION; ANTENNA-ARRAY; ALGORITHM;

D O I：

10.1109/TIM.2012.2202183

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A measurement setup for imaging applications is presented. The idea is to reuse an existing antenna measurement setup to develop the imaging system by using a frequency scanning antenna array that focuses the incident field on the object under test (OUT) at different angular positions by means of a frequency sweep. From the measured total field data, an inverse technique based on source reconstruction is proposed to recover the OUT profile. In order to check the feasibility of the proposed setup and for the sake of simplicity, the OUTs to be dealt with present translation symmetry along one dimension (2-D problems). Measurement results and full-wave method-of-moment simulations are presented to test the proposed setup as well as to point out the frequency scanning capabilities.

引用

页码：3014 / 3023

页数：10

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