Recent developments in surface analysis

被引：0
|
作者：
Shichi, Y
Akutsu, M
机构：
来源：
JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS | 1997年 / 42卷 / 09期
关键词：
surface analysis; XPS; AES; SIMS; EPMA; FT-IR; Raman spectroscopy; in situ analysis;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：695 / 699
页数：5
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