Direct measurement of the Laplace pressure in a very thin liquid film

被引:6
|
作者
Zhang, B [1 ]
Nakajima, A [1 ]
机构
[1] Saga Univ, Fac Sci & Engn, Saga 8408502, Japan
关键词
nanotechnology; surface force; meniscus force; the Laplace pressure;
D O I
10.1006/jcis.2001.7985
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Meniscus force plays an important part in magnetic storage devices, scanning probe microscopy, and micromachines, because the meniscus force increases steeply as the clearance between solid surfaces decreases down to submicrometers. Recently increased experimental and analytical studies on the subject have been published from the point of view of mechanical engineering. Meniscus force is generated by the Laplace pressure within the thin liquid film. Investigating the Laplace pressure is a direct way to clarify the generation mechanism of meniscus force. However, no appropriate measuring method of the Laplace pressure is available for a very thin liquid film confined by solid surfaces. This paper proposes a simple method of direct measurement of the Laplace pressure for the cases. The principle of the measurement method is described. Measurement is conducted using the measuring device. Experimental results on the Laplace pressure show good agreement with the theoretical predictions. (C) 2002 Elsevier Science.
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页码:215 / 218
页数:4
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