Electrical scanning probe microscopy of thin films for CIGS-based solar cells

被引：0
|
作者：
Abrahamson, Joel T. [1 ]
Tosun, B. Selin [1 ]
Johnson, Forrest [2 ]
Haugstad, Greg [3 ]
Campbell, Stephen A. [2 ]
Aydil, Eray S. [1 ]
机构：
[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
[2] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
[3] Univ Minnesota, Characterizat Facil, Minneapolis, MN 55455 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2013年 / 245卷
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D O I：
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
85-ENFL
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页数：1
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