The study of fast measurement hexahedron verticality error by wavefront interferometer

被引:1
|
作者
Peng, Shijun [1 ]
Gao, Songtao [1 ]
Wu, Dongcheng [1 ]
Miao, Erlong [1 ]
机构
[1] Chinese Acad Sci, Engn Res Ctr Extreme Precis Opt, State Key Lab Appl Opt, Changchun Inst Opt Mech & Phys, Changchun 130001, Peoples R China
关键词
Wavefront Interferometer; Collimator; Verticality Error; Hexahedron;
D O I
10.1117/12.2246394
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper proposes a method to measure hexahedron vertical error based on wavefront interferometer and collimator. The setup of the measurement system and measurement steps is described. Comparing the vertical error of the same hexahedral surface adjacent measured by coordinate measurement machine, the validity of the measurement method is verified. Then not only the verticality error, but also form and shape error data of the two measured surface can be derived. The verticality error of adjacent surface is measured by the combination measurement method. Then surface figure error data for the two surfaces is measured by wavefront interferometer. The form and shape error data of one surface relative to the other can be obtained by added the verticality error to the surface figure error. This is very important in the part's error correction machining process. The effectiveness of the processing method has been verified by experiment. This method can achieve high measurement accuracy of 0.5 '' and can be extended to high-precision shape and position errors measurement for other polyhedral parts.
引用
收藏
页数:11
相关论文
共 50 条
  • [21] Wavefront measurement using a grating interferometer in the X-ray region
    Matsuyama, Satoshi
    Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 2019, 85 (08): : 680 - 684
  • [22] Diffraction wavefront analysis of point diffraction interferometer for measurement of aspherical surface
    Gao Fen
    Jiang Zhuang-de
    Li Bing
    5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, 2010, 7656
  • [23] Effects of phase shifting error upon the Self-referencing interferometer wavefront sensor
    Vincent, R. Anthony
    Oesch, Denis W.
    Sanchez, Darryl J.
    ASTRONOMICAL ADAPTATIVE OPTICS SYSTEMS AND APPLICATIONS III, 2007, 6691
  • [25] Wavefront measurement error in a Hartmann-Shack-type wavefront sensor due to field anisoplanatism
    Woeger, Friedrich
    Rimmele, Thomas
    ADAPTIVE OPTICS SYSTEMS, PTS 1-3, 2008, 7015
  • [26] A Method of Calculating Structural Error in Interferometer Measurement System
    Cui, Jianzhang
    Zhang, Ming
    Zhu, Yu
    Ni, Chang
    2016 6TH INTERNATIONAL CONFERENCE ON INFORMATION TECHNOLOGY FOR MANUFACTURING SYSTEMS (ITMS 2016), 2016, : 201 - 205
  • [27] Dynamic wavefront measurement with a pinhole linear polarizer point-diffraction interferometer
    Zhou, Xiang
    Guo, Renhui
    Zhu, Wenhua
    Zheng, Donghui
    Chen, Lei
    APPLIED OPTICS, 2017, 56 (29) : 8040 - 8047
  • [28] THE MEASUREMENT OF ELECTRON-CONCENTRATION IN PLASMA, USING SUBMILLIMETER INTERFEROMETER WITH THE WAVEFRONT FISSION
    VORONIN, AV
    KUZNETSOV, VM
    TUMAKAEV, GK
    ZHURNAL TEKHNICHESKOI FIZIKI, 1981, 51 (11): : 2299 - 2301
  • [29] Radius of curvature measurement based on wavefront difference method by the point diffraction interferometer
    Yang, Zhongming
    Gao, Zhishan
    Yuan, Qun
    Ye, Jingfei
    Li, Minjue
    OPTICS AND LASERS IN ENGINEERING, 2014, 56 : 35 - 40
  • [30] Near infrared reflective shearing point diffraction interferometer for dynamic wavefront measurement
    Zhu, Wenhua
    Chen, Lei
    Zheng, Donghui
    8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY: OPTICAL TEST, MEASUREMENT TECHNOLOGY, AND EQUIPMENT, 2016, 9684