Beamline-induced chromium structure in carbon K-edge absorption spectra

被引：8

作者：

Schnadt, J

Schiessling, J

O'Shea, JN

Patthey, L

Shi, M

Puglia, C

Mårtensson, N

Brühwiler, PA

机构：

[1] Uppsala Univ, Dept Phys, SE-75121 Uppsala, Sweden

[2] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England

[3] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland

[4] Lund Univ, MAX Lab, S-22100 Lund, Sweden

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2001年 / 184卷 / 04期

关键词：

X-ray absorption spectroscopy; CK-edge; Cr subcoating; beamline instrumentation; X-ray optics;

D O I：

10.1016/S0168-583X(01)00796-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We show that Cr subcoatings in beamline optical elements can introduce an additional structure in C K-edge X-ray absorption measurements. which somewhat resembles the well-known losses produced by carbon contamination. The photon throughput variations induced by Cr and C require different treatments when correcting absorption spectra. The potential difficulties in unravelling the two effects could be avoided with efficient filtration of higher-order light. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：609 / 614

页数：6

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