Beamline-induced chromium structure in carbon K-edge absorption spectra

被引：8
|
作者：
Schnadt, J
Schiessling, J
O'Shea, JN
Patthey, L
Shi, M
Puglia, C
Mårtensson, N
Brühwiler, PA
机构：
[1] Uppsala Univ, Dept Phys, SE-75121 Uppsala, Sweden
[2] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD, England
[3] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland
[4] Lund Univ, MAX Lab, S-22100 Lund, Sweden
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2001年 / 184卷 / 04期
关键词：
X-ray absorption spectroscopy; CK-edge; Cr subcoating; beamline instrumentation; X-ray optics;
D O I：
10.1016/S0168-583X(01)00796-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We show that Cr subcoatings in beamline optical elements can introduce an additional structure in C K-edge X-ray absorption measurements. which somewhat resembles the well-known losses produced by carbon contamination. The photon throughput variations induced by Cr and C require different treatments when correcting absorption spectra. The potential difficulties in unravelling the two effects could be avoided with efficient filtration of higher-order light. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：609 / 614
页数：6
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