500 GHz-750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

被引:60
|
作者
Williams, Dylan F. [1 ]
机构
[1] NIST, Boulder, CO 80305 USA
关键词
Calibration; submillimeter wave; uncertainty analysis; vector network analyzer;
D O I
10.1109/TTHZ.2011.2127370
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art WM-380 (WR 1.5) rectangular-waveguide vector-network-analyzer measurements over the frequency range 500-750 GHz. We use the analysis to assess thru-reflect-line, thru-short-match, and thru-short-radiating-open calibrations. The comparison shows that thru-short-match and thru-short-radiating-open calibrations outperform thru-reflect-line calibrations, and that this is true even when multiple lines and optimal averaging are used to improve the thru-reflect-line calibrations.
引用
收藏
页码:364 / 377
页数:14
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