Non-contact on-line layer thickness measurement in industrial coating processes

被引:0
|
作者
Schulz, H
Kohns, P
Scheidt, A
Hayk, M
Zhou, P
机构
来源
TECHNISCHES MESSEN | 1997年 / 64卷 / 03期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A non-contact and non-destructive method for the measurement of the layer thickness in an industrial coating process is described. The method is based on the time-resolved measurement of the temperature of the coated surface during and after the irradiation with a laser pulse. The measurement time of this photothermal technique is only several 10 ms for coating thicknesses in the order of 100 mu m, which is significantly shorter than the measurement with thermal waves. This enables the use of the technique even on moved objects without moving the measurement system. The measurement is done on the wet paint and calibrated on the thickness of the dry coating after stoving of the paint. The resolution related to the layer thickness after stoving is about +/-1 mu m for a thickness range from 10 to 100 mu m. The new measurement technique is able to measure the distribution of the layer thickness on the coated object just after paint application in order to optimize the paint application process.
引用
收藏
页码:100 / 105
页数:6
相关论文
共 50 条
  • [31] Non-contact intelligent system on-line to monitor the leakage weak current
    Liu, Hongli
    Wuhan Jiaotong Keji Daxue Xuebao/Journal of Wuhan Transportation University, 2000, 24 (03): : 250 - 253
  • [32] Fixed mounted infrared 2D and line cameras for industrial non-contact temperature measurement
    Drögmöller, P
    Budzier, H
    Hofmann, G
    Krause, V
    Reichardt, T
    Vollheim, B
    Vollheim, J
    Gerlach, G
    THERMOSENSE XXV, 2003, 5073 : 41 - 50
  • [33] Non-contact film thickness measurement with time domain terahertz technology
    Cook, David
    Lee, Seonkyung
    Sharpe, Scott
    Allen, Mark
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 232 : 822 - 822
  • [34] Non-Contact Thickness Measurement System Using a Smart Cantilever Beam
    S. Yenuganti
    S. Paliwal
    M. Peparthi
    Experimental Techniques, 2023, 47 : 1161 - 1167
  • [35] Non-Contact Thickness Measurement System Using a Smart Cantilever Beam
    Yenuganti, S.
    Paliwal, S.
    Peparthi, M.
    EXPERIMENTAL TECHNIQUES, 2023, 47 (06) : 1161 - 1167
  • [36] Non-contact measurement of contact wire
    Yi Yaxing
    Ye Xuemei
    Li Zhongke
    Yue Kaiduan
    2008 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND APPLICATIONS, 2009, 7160
  • [37] Non-contact, optical measurement of lens capsule thickness ex vivo
    Ziebarth, N
    Manns, F
    Uhlhorn, S
    Parel, JM
    OPHTHALMIC TECHNOLOGIES XIV, 2004, 5314 : 1 - 9
  • [38] A Linear Non-Contact Measurement of Dielectric Thickness with μm-Resolution
    Rastogi, Surbhika
    Devaraj, Surya Varchasvi
    Zele, Rajesh
    2023 IEEE SENSORS, 2023,
  • [39] NON-CONTACT MEASUREMENT OF THE THICKNESS AND DIELECTRIC PARAMETERS OF DIELECTRIC PLATES AND SHELLS
    Matiss, I.
    LATVIAN JOURNAL OF PHYSICS AND TECHNICAL SCIENCES, 2015, 52 (02) : 49 - 58
  • [40] A Low-Cost Instrument for Precision non-Contact Thickness measurement
    Wang, Jyhwen
    Tiwari, Sanjay
    JOURNAL OF ENGINEERING TECHNOLOGY, 2010, 27 (01) : 28 - 34