A methodology for nanosecond (or better) time resolved thermoreflectance imaging with coherence control of laser pulses

被引:9
|
作者
Soni, Alok [1 ]
Sundaram, Vijay M. [1 ]
Wen, Sy-Bor [1 ]
机构
[1] Texas A&M Univ, Dept Mech Engn, College Stn, TX 77843 USA
基金
美国国家科学基金会;
关键词
SPECKLE REDUCTION; TEMPERATURE; RESOLUTION; DEVICES;
D O I
10.1063/1.4807598
中图分类号
O59 [应用物理学];
学科分类号
摘要
A time-domain thermoreflectance imaging methodology with pulsed laser illumination is developed to achieve nanosecond time resolution with diffraction limited spatial resolution. Validation of the proposed methodology through a transient temperature measurement of a micro gold resistor under similar to 110 ns pulsed heating is demonstrated, which shows consistency with the corresponding numerical simulation. This approach allows us to determine the transient energy transport in miniature structures, such as microelectronic and nano-photonic devices. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:3
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