Defect Localisation in Photovoltaic Panels with the Help of Synchronized Thermography

被引：0

作者：

Schuss, Christian ^{[1
]}

Remes, Kari ^{[2
]}

Leppanen, Kimmo ^{[3
]}

Saarela, Juha ^{[2
]}

Fabritius, Tapio ^{[2
]}

Eichberger, Bernd ^{[4
]}

Rahkonen, Timo ^{[1
]}

机构：

[1] Univ Oulu, CAS, Oulu, Finland

[2] Univ Oulu, Optoelect & Measurement Tech Lab, Oulu, Finland

[3] Oy GW Berg & Co Ab, Vantaa, Finland

[4] Graz Univ Technol, Inst Elect Sensor Syst, Graz, Austria

来源：

2017 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) | 2017年

关键词：

defect; interconnection; photovoltaic cell; photovoltaic panel; solar energy; synchronized thermography; LOCK-IN THERMOGRAPHY; TEMPERATURE; SIMULATION; CELLS; MODEL;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper investigates defects in photovoltaic (PV) panels, more precisely, the location of defects in PV panels. With the help of electrical verification, it is possible to verify the impact of defects on output performances. However, it is not possible to determine the location of defects in order to address problems, for example in the manufacturing process of PV panels. In this paper, the focus lies on finding similarities in the location of defect areas in PV panels. Samples were characterised with the help of synchronized thermography (ST) in order to obtain infrared (IR) images of PV panels. IR-images are helpful to get a visual image on the health of PV panels and identify the position of defects. This information can be useful, for example to improve the fabrication process of PV panels.

引用

页码：1270 / 1275

页数：6

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