A method for fault diagnosis in nonlinear analog circuit based on neural network

被引：0
|
作者：
Yuan, HY [1 ]
Chen, GJ [1 ]
机构：
[1] Univ Elect Sci & Technol China, Chengdu 610054, Peoples R China
来源：
ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 8 | 2005年
关键词：
analog circuit; wavelet-neural network; fault diagnosis;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Fault diagnosis in nonlinear analog circuit based on neural network is presented in this paper. The diagnosis is based on time-frequency area analysis and artificial neural network, which provides a considerable novel problem-solving scheme for the fault diagnosis in analog circuit. Compared with the classical methods, the method presented in this paper with the advantages: the less work before test, the more simple diagnosis process, the more quick diagnosis, the real time diagnosis in analogy circuit. The availability of this method is validated by a diagnosis illustration.
引用
收藏
页码：66 / 70
页数：5
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