Prospects for Reliable 3D Imaging in Aberration-corrected STEM, TEM and SCEM

被引：5
|
作者：
Xin, Huolin L. [1 ]
Muller, David A. [2 ]
机构：
[1] Cornell Univ, Dept Phys, Ithaca, NY 14853 USA
[2] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
RESOLUTION;
D O I：
10.1017/S1431927609095622
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1474 / 1475
页数：2
相关论文
共 50 条
  • [31] Aberration-corrected STEM and EELS of semiconducting anostructures
    Cui, K.
    Vajargah, S. Hosseini
    Woo, S. Y.
    Couillard, M.
    Lazar, S.
    Kleiman, R. N.
    Thompson, D. A.
    Botton, G. A.
    17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 2011, 326
  • [32] Aberration-corrected HREM/STEM for semiconductor research
    Hetherington, C. J. D.
    Cockayne, D. J. H.
    Doole, R. C.
    Hutchison, J. L.
    Kirkland, A. I.
    Titchmarsh, J. M.
    MICROSCOPY OF SEMICONDUCTING MATERIALS, 2005, 107 : 177 - 182
  • [33] Application of aberration-corrected TEM and image simulation to nanoelectronics and nanotechnology
    Korgel, Brian A.
    Lee, D. C.
    Hanrath, Tobias
    Yacaman, Miguel Jose
    Thesen, Alexander
    Matijevic, Marco
    Kilaas, Roar
    Kisielowski, Christian
    Diebold, Alain C.
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2006, 19 (04) : 391 - 396
  • [34] Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM
    Chang, L. Y.
    Lazar, S.
    Baranova, E. A.
    Bock, C.
    Botton, G. A.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 1416 - 1417
  • [35] Calculations of spherical aberration-corrected imaging behaviour
    Chang, LY
    Chen, FR
    Kirkland, AI
    Kai, JJ
    JOURNAL OF ELECTRON MICROSCOPY, 2003, 52 (04): : 359 - 364
  • [36] In-situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in an Aberration-Corrected STEM/TEM
    Liu, Jingyue
    Braddock-Wilking, Janet
    Allard, Lawrence F.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 688 - 689
  • [37] Applications of aberration-corrected TEM-STEM and high-resolution EELS in materials research
    Botton, Gianluigi
    Maunders, Christian
    Gunawan, Lina
    Cui, Kai
    Chang, Lan-Yun
    Lazar, Sorin
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C66 - C66
  • [38] Aberration-corrected quantum temporal imaging system
    Zhu, Yunhui
    Kim, Jungsang
    Gauthier, Daniel J.
    PHYSICAL REVIEW A, 2013, 87 (04):
  • [39] Aberration-corrected STEM imaging of 2D materials: Artifacts and practical applications of threefold astigmatism
    Lopatin, Sergei
    Aljarb, Areej
    Roddatis, Vladimir
    Meyer, Tobias
    Wan, Yi
    Fu, Jui-Han
    Hedhili, Mohamed
    Han, Yimo
    Li, Lain-Jong
    Tung, Vincent
    SCIENCE ADVANCES, 2020, 6 (37)
  • [40] Understanding Catalyst Stability Through Aberration-corrected STEM
    Lupini, A. R.
    Veith, G. M.
    Dudney, N. J.
    Pennycook, S. J.
    MICROSCOPY AND MICROANALYSIS, 2009, 15 : 1408 - 1409
12345