Prospects for Reliable 3D Imaging in Aberration-corrected STEM, TEM and SCEM

被引：5
|
作者：
Xin, Huolin L. [1 ]
Muller, David A. [2 ]
机构：
[1] Cornell Univ, Dept Phys, Ithaca, NY 14853 USA
[2] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
RESOLUTION;
D O I：
10.1017/S1431927609095622
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1474 / 1475
页数：2
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