Use of Artificial Intelligence Techniques to Fault Diagnosis in Analog Systems

被引：0
|
作者：
Rutkowski, Jerzy [1 ]
Grzechca, Damian [1 ]
机构：
[1] Silesian Tech Univ, Dept Automat Control Elect & Comp Sci, Akad St 16, PL-44100 Gliwice, Poland
来源：
PROCEEDINGS OF THE 2ND EUROPEAN COMPUTING CONFERENCE: NEW ASPECTS ON COMPUTERS RESEACH | 2008年
关键词：
Analog electronic fault diagnosis; parametric faults; artificial intelligence; NEURAL-NETWORK; GENETIC-ALGORITHM; CIRCUITS; SIGNAL; TIME; SELECTION;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
Basic concepts of fault diagnosis in analog and mixed (analog and digital) electronic systems by means of the simulation-before-test approach, the so called dictionary approach, have been presented. Special attention has been paid to application of artificial intelligence tools, such as: artificial neural networks, fuzzy sets and evolutionary computing.
引用
收藏
页码：267 / +
页数：4
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