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- [42] Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction Journal of Materials Science: Materials in Electronics, 1999, 10 : 203 - 208
- [43] An experimental method for measuring the Poisson's ratio in thin films and multilayers using a tensile machine set up on an X-ray goniometer EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2000, 10 (02): : 91 - 96
- [47] Depth-resolved strain measurements in thin films by energy-variable X-ray diffraction NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 246 (01): : 244 - 248