Poisson's ratio of BiFeO3 thin films: X-ray reciprocal space mapping under variable uniaxial strain

被引：13

作者：

Hu, S. ^{[1
]}

Alsubaie, A. ^{[1
,2
]}

Wang, Y. ^{[3
]}

Lee, J. H. ^{[4
]}

Kang, K. -R. ^{[5
]}

Yang, C. -H. ^{[4
,5
]}

Seidel, J. ^{[1
]}

机构：

[1] UNSW Australia, Sch Mat Sci & Engn, Sydney, NSW, Australia

[2] Taif Univ, Sch Phys, At Taif, Saudi Arabia

[3] UNSW Australia, Solid State & Elemental Anal Unit, Mark Wainwright Analyt Ctr, Sydney, NSW, Australia

[4] Korea Adv Inst Sci & Technol, Dept Phys, Daejeon 34141, South Korea

[5] Korea Adv Inst Sci & Technol, Inst NanoCentury, Daejeon 34141, South Korea

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2017年 / 214卷 / 01期

基金：

澳大利亚研究理事会; 新加坡国家研究基金会;

关键词：

BiFeO3; elastic properties; mechanical properties; multiferroics; thin films; X-ray diffraction; THERMAL-EXPANSION COEFFICIENT; DOMAIN-WALLS; STRESS;

D O I：

10.1002/pssa.201600356

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigate the mechanical properties of BiFeO3 (BFO) thin films grown on SrTiO3 (001) substrates that were manually bent using a specially designed uniaxial bending stage. X-ray measurements under variable uniaxial strain show that excessive strains up to approximate to 2% could be applied along the [100] direction with little cross talk between [100] and [010] directions. X-ray reciprocal space maps were acquired to investigate the evolution of -a and c-axis lattice constants under variable strain and Poisson's ratio of BFO thin films v(zx) was determined to be 0.30 +/- 0.01.

引用

页数：5

共 50 条

[1] Structural characterization of BiFeO3 thin films by reciprocal space mapping
Saito, Keisuke
Ulyanenkov, Alexander
Grossmann, Volkmar
Ress, Heiko
Bruegemann, Lutz
Ohta, Hideo
Kurosawa, Toshiyuki
Ueki, Sadao
Funakubo, Hiroshi
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (9B): : 7311 - 7314
[2] X-ray diffraction study of polycrystalline BiFeO3 thin films under electric field
Nakashima, Seiji
Sakata, Osami
Nakamura, Yoshitaka
Kanashima, Takeshi
Funakubo, Hiroshi
Okuyama, Masanori
APPLIED PHYSICS LETTERS, 2008, 93 (04)
[3] Observation of antiphase domains in BiFeO3 thin films by X-ray diffraction
Wan, Li
Li, Yawei
Meng, Xangjian
Sun, Jinglan
Yuan, Xianzhang
Shangguan, Jinsi
Chu, Junhao
PHYSICA B-CONDENSED MATTER, 2007, 391 (01) : 124 - 129
[4] X-ray diffraction studies of stripelike ferroelectric domains in thin films of BiFeO3
Lee, J. C. T.
Damodaran, A. R.
Ramesh, R.
Martin, L. W.
Abbamonte, P.
PHYSICAL REVIEW B, 2014, 89 (21):
[5] Investigation on the origin of the magnetic moment of BiFeO3 thin films by advanced X-ray characterizations
Bea, Helene
Bibes, Manuel
Fusil, Stephane
Bouzehouane, Karim
Jacquet, Eric
Rode, Karsten
Bencok, Peter
Barthelemy, Agnes
PHYSICAL REVIEW B, 2006, 74 (02)
[6] Strain-driven phase boundaries in BiFeO3 thin films studied by atomic force microscopy and x-ray diffraction
Liu, Heng-Jui
Liang, Chen-Wei
Liang, Wen-I
Chen, Hsiang-Jung
Yang, Jan-Chi
Peng, Chun-Yen
Wang, Guang-Fu
Chu, Feng-Nan
Chen, Yi-Chun
Lee, Hsin-Yi
Chang, Li
Lin, Su-Jien
Chu, Ying-Hao
PHYSICAL REVIEW B, 2012, 85 (01)
[7] Determination of Young's modulus and Poisson's ratio of thin films by X-ray methods
Fu, Wei-En
Chang, Yong-Qing
He, Bo-Ching
Wu, Chung-Lin
THIN SOLID FILMS, 2013, 544 : 201 - 205
[8] Competing phases in BiFeO3 thin films under compressive epitaxial strain
Dupe, B.
Infante, I. C.
Geneste, G.
Janolin, P. -E.
Bibes, M.
Barthelemy, A.
Lisenkov, S.
Bellaiche, L.
Ravy, S.
Dkhil, B.
PHYSICAL REVIEW B, 2010, 81 (14)
[9] Two-dimensional mapping of triaxial strain fields in a multiferroic BiFeO3 thin film using scanning x-ray microdiffraction
Bark, Chung W.
Cho, Kyung C.
Koo, Yang M.
Tamura, Nobumichi
Ryu, Sangwoo
Jang, Hyun M.
APPLIED PHYSICS LETTERS, 2007, 90 (10)
[10] Reciprocal space mapping and strain scanning using X-ray diffraction microscopy
Poulsen, H.F. (hfpo@fysik.dtu.dk), 1600, Wiley-Blackwell (51):

← 1 2 3 4 5 →