Effect Of Zn Incorporation On The Optical Properties Of Thin Films Of Se85Te15 Glassy Alloy

Amorphous thin films of Se85-xTe15Znx (x = 4, 6 and 10) have been prepared by vacuum evaporation technique. The transmittance of as-deposited thin films was measured in the wavelength region 400-1800 nm. The optical band gap and optical constants of amorphous thin films have been studied as a function of wavelength. It has been found that the value of refractive index (n) decreases while the value of the extinction coefficient (k) increases with increasing wavelength. Also the value of optical band gap increases on incorporation of Zn in Se85-xTe15Znx system. The results are interpreted in terms of electronegativity difference of the elements involved.