Atomic-resolution transmission electron microscopy of electron beam-sensitive crystalline materials

被引:398
|
作者
Zhang, Daliang [1 ]
Zhu, Yihan [2 ,4 ]
Liu, Lingmei [2 ]
Ying, Xiangrong [2 ]
Hsiung, Chia-En [2 ]
Sougrat, Rachid [1 ]
Li, Kun [1 ]
Han, Yu [2 ,3 ]
机构
[1] KAUST, Imaging & Characterizat Core Lab, Thuwal 239556900, Saudi Arabia
[2] KAUST, Adv Membranes & Porous Mat Ctr, Phys Sci & Engn Div, Thuwal 239556900, Saudi Arabia
[3] KAUST, KAUST Catalysis Ctr, Phys Sci & Engn Div, Thuwal 239556900, Saudi Arabia
[4] Zhejiang Univ Technol, Dept Chem Engn, Hangzhou 310014, Zhejiang, Peoples R China
关键词
METAL-ORGANIC FRAMEWORK; CRYO-EM; DAMAGE; RECONSTRUCTION; NANOCRYSTALS; TEMPERATURE; GRAPHENE; SURFACE; TEM;
D O I
10.1126/science.aao0865
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
High-resolution imaging of electron beam-sensitive materials is one of the most difficult applications of transmission electron microscopy (TEM). The challenges are manifold, including the acquisition of images with extremely low beam doses, the time-constrained search for crystal zone axes, the precise image alignment, and the accurate determination of the defocus value. We develop a suite of methods to fulfill these requirements and acquire atomic-resolution TEM images of several metal organic frameworks that are generally recognized as highly sensitive to electron beams. The high image resolution allows us to identify individual metal atomic columns, various types of surface termination, and benzene rings in the organic linkers. We also apply our methods to other electron beam-sensitive materials, including the organic-inorganic hybrid perovskite CH3NH3PbBr3.
引用
收藏
页码:675 / +
页数:5
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