Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron X-ray reflectometry

Rutherford backscattering and synchrotron x-ray reflectometry was used to analyse the depth profile of elements in a sputtered iron thin film of originally 20 nm thickness following corrosion heat treatments. An ''up to self-consistency'' simultaneous evaluation of both kinds of spectra allowed for accurate determination both elemental composition and thickness of the sub-layers. Different iron oxide and oxi-hydroxide layers were identified on top of the iron layer depending on the treatment. An oxide layer of overall composition close to Fe2O3 was also observed at the iron/glass interface.