Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron X-ray reflectometry

被引：2
|
作者：
Szilagyi, E
Bottyan, L
Deak, L
Gerdau, E
Gittsovich, VN
Grof, A
Kotai, E
Leupold, O
Nagy, DL
Semenov, VG
机构：
[1] UNIV HAMBURG, INST EXPT PHYS, D-22761 HAMBURG, GERMANY
[2] ST PETERSBURG STATE UNIV, INST CHEM, ST PETERSBURG 198904, RUSSIA
来源：
MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES | 1997年 / 248-2卷
关键词：
depth profiling; Rutherford backscattering; X-ray reflectometry; synchrotron radiation; corrosion; thin films; SURFACES; SPECTRA;
D O I：
10.4028/www.scientific.net/MSF.248-249.365
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Rutherford backscattering and synchrotron x-ray reflectometry was used to analyse the depth profile of elements in a sputtered iron thin film of originally 20 nm thickness following corrosion heat treatments. An ''up to self-consistency'' simultaneous evaluation of both kinds of spectra allowed for accurate determination both elemental composition and thickness of the sub-layers. Different iron oxide and oxi-hydroxide layers were identified on top of the iron layer depending on the treatment. An oxide layer of overall composition close to Fe2O3 was also observed at the iron/glass interface.
引用
收藏
页码：365 / 368
页数：4
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