Probe diagnostics for fusion devices

被引：0
|
作者：
Van Oost, G [1 ]
机构：
[1] Univ Ghent, Dept Appl Phys, Rozier 44, B-9000 Ghent, Belgium
来源：
FUSION SCIENCE AND TECHNOLOGY | 2006年 / 49卷 / 2T期
关键词：
D O I：
10.13182/FST06-A1135
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：357 / 366
页数：10
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