Optimization of process parameters in high-energy film radiography

Film radiography provides unequaled resolution for component and assembly inspection, certification, and quality evaluations. However, improvements can be made in our ability to identify defects and to obtain much more detail about fine features. A systematic approach to make incremental changes in current high-energy radiography may well provide the additional improvement needed. Consequently, the work described is concerned with optimizing important parameters affecting image quality. Modeling and simulation with advanced parallel computer systems provide a more detailed understanding of latent image formation at high x-ray energies and help explain image degradation mechanisms in enhancement screens.