Optical sectioning microscopy with both mechanical and non-mechanical beam scanning mechanisms

被引：0
|
作者：
Buddha, S. S. Goutam [1 ]
Kalita, Ranjan [1 ]
Boruah, Bosanta R. [1 ]
机构：
[1] Indian Inst Technol Guwahati, Gauhati, India
来源：
2019 WORKSHOP ON RECENT ADVANCES IN PHOTONICS (WRAP) | 2019年
关键词：
microscopy; beam scanning; computer generated holography; galvanometer based scanner;
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Optical sectioning microscopy is an important imaging technique best known for its ability to produce high contrast images of the specimen. Image is formed by scanning the focused illumination beam over the specimen plane normally with the help of a mechanical scanner. In this work, we have developed an optical sectioning microscope which has both mechanical as well as non-mechanical beam scanning mechanisms.
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页数：3
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