In-situ Fmax/Vmin tracking for energy efficiency and reliability optimization

被引:0
|
作者
Miro-Panades, Ivan [1 ]
Beigne, Edith
Billoint, Olivier
Thonnart, Yvain
机构
[1] Univ Grenoble Alpes, F-38000 Grenoble, France
关键词
design margins reduction; in-situ monitors; TMFLT; ERROR-DETECTION;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Achieving the lowest possible operating voltage is needed to minimize the power consumption of a circuit but also to increase its reliability w.r.t hardware errors. An in-situ technique to estimate and reduce the design margins of a circuit is presented which significantly minimizes the operating voltage and tracks it during run-time operation of a circuit without failure. A DSP core embedding this technique has been fabricated and measured. Its V-MIN has been estimated within +3.5%/-2.5% at nominal clock frequency (1600MHz), thus reducing by 19% its energy per operation.
引用
收藏
页码:96 / 99
页数:4
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