Fourth order phase-field model for local max-ent approximants applied to crack propagation

被引:60
|
作者
Amiri, Fatemeh
Millan, Daniel [3 ,4 ]
Arroyo, Marino [5 ]
Silani, Mohammad [8 ]
Rabczuk, Timon [1 ,2 ,6 ,7 ]
机构
[1] Ton Duc Thang Univ, Div Computat Mech, Ho Chi Minh City, Vietnam
[2] Ton Duc Thang Univ, Fac Civil Engn, Ho Chi Minh City, Vietnam
[3] Natl Univ Cuyo, Natl Sci & Tech Res Council, RA-5500 Mendoza, Argentina
[4] Natl Univ Cuyo, Fac Exact & Nat Sci, RA-5500 Mendoza, Argentina
[5] Univ Politecn Cataluna, ETSECCPB, Sch Civil Engn Barcelona, Dept Matemat Aplicada 3, Catalunya, Spain
[6] Korea Univ, Sch Civil Environm & Architectural Engn, Seoul 136701, South Korea
[7] Bauhaus Univ Weimar, Inst Struct Mech, D-99423 Weimar, Germany
[8] Isfahan Univ Technol, Dept Mech Engn, Esfahan 8415683111, Iran
关键词
Fracture; Local maximum entropy; Second order phase-field model; Fourth order phase-field model; MAXIMUM-ENTROPY APPROXIMANTS; ARBITRARY EVOLVING CRACKS; EXTENDED FINITE-ELEMENT; FREE GALERKIN METHOD; THIN-SHELL ANALYSIS; BRITTLE-FRACTURE; MESHLESS METHODS; MESHFREE METHOD; ISOGEOMETRIC ANALYSIS; NUMERICAL-SIMULATION;
D O I
10.1016/j.cma.2016.02.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We apply a fourth order phase-field model for fracture based on local maximum entropy (LME) approximants. The higher order continuity of the meshfree LME approximants allows to directly solve the fourth order phase-field equations without splitting the fourth order differential equation into two second order differential equations. We will first show that the crack surface can be captured more accurately in the fourth order model. Furthermore, less nodes are needed for the fourth order model to resolve the crack path. Finally, we demonstrate the performance of the proposed meshfree fourth order phase-field formulation for 5 representative numerical examples. Computational results will be compared to analytical solutions within linear elastic fracture mechanics and experimental data for three-dimensional crack propagation. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:254 / 275
页数:22
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