Ultra-low temperature anodic bonding of silicon and borosilicate glass

被引:12
|
作者
Knapkiewicz, Pawel [1 ]
机构
[1] Wroclaw Univ Sci & Technol, Fac Microsyst Elect & Photon, Wroclaw, Poland
关键词
low temperature bonding; silicon; glass; technology;
D O I
10.1088/1361-6641/aafecc
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ultra-low temperature anodic bonding of silicon and borosilicate glass has been described for the first time. The article gives the arguments why the issue of non-standard anodic bonding of silicon and glass is important. Some examples of solutions were indicated, in which the development of a new anodic bonding method was crucial for the development of the final solution. A series of experiments were carried out, the effect of which was the obtaining of a permanent connection of silicon and glass at a temperature of 120 degrees C. Optimal conditions of the ultra-low temperature of the anodic bonding process were given. The bonding force was tested, which was more than 1.5 MPa.
引用
收藏
页数:5
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