Real-Time Hardware-in-the-Loop (HIL) Testing for Power Electronics Controllers

被引：0

作者：

Tae, Seung Cha ^{[1
]}

Wu, Qiuwei ^{[1
]}

Nielsen, Arne Hejde ^{[1
]}

Ostergaard, Jacob ^{[1
]}

Kwon, In Park ^{[2
]}

机构：

[1] Tech Univ Denmark DTU, Dept Elect Engn, Lyngby, Denmark

[2] RTDS Technol Inc, Winnipeg, MB, Canada

来源：

2012 ASIA-PACIFIC POWER AND ENERGY ENGINEERING CONFERENCE (APPEEC) | 2012年

关键词：

Hardware-in-the-loop (HIL); power electronics controllers; real time digital simulator (RTDS); digital signal processor (DSP); PROGRESS;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

This paper discusses general approaches and results of real-time hardware-in-the-loop (HIL) testing for power electronics controllers. Many different types of power electronic controllers can be tested by connecting them to a real-time digital simulator (RTDS) for closed-loop HIL testing. In this paper, two HIL digital controller tests are presented as application examples of the low-level signal interface in the closed-loop tests of power electronic controllers. In the HIL tests, the power system and the power electronics hardware are modeled in the RTDS. The required control functions of the power electronics hardware are not included in the RTDS. Instead, the control algorithms are coded using the native C code and downloaded to the dedicated digital signal processor (DSP)/microcontrollers. The two experimental applications illustrate the effectiveness of the HIL controller testing. Results of the HIL tests and hardware validations are presented to illustrate the real-time HIL testing method for power electronics controllers.

引用

页数：6

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