RAS Technology of the SX-9

被引：0

作者：

Kobayashi, Katsumi ^{[1
]}

Yonemura, Takashi ^{[1
]}

Takahashi, Kiyoaki ^{[2
]}

Nakaso, Hiroko ^{[1
]}

机构：

[1] NEC Corp Ltd, Comp Operat Unit 1, Comp Div, Minato Ku, Tokyo 1088001, Japan

[2] NEC Software Hokuriku Ltd, Solut Business Div 3, Tokyo, Japan

来源：

NEC TECHNICAL JOURNAL | 2008年 / 3卷 / 04期

关键词：

RAS; Reliability; Availability; Serviceability; failure detection; auto recovery reconfiguration; maintenance diagnostics;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Supercomputer SX-9 concentrates improvement technologies that have been refined over NEC's long years of experience in order to meet the requirements of high reliability and to provide support for the circuitry to the system levels. Reliability, Availability and Serviceability are thus attained at more advanced levels. This paper introduces the RAS technology based on the latest innovations of the SX-9.

引用

页码：39 / 42

页数：4

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